A Comprehensive Range of FTIR Spectrometers

A Comprehensive Range of FTIR Spectrometers

For many applications from education and routine analysis to high level research including optimized systems for materials analysis, such as characterization & identification, film thickness, gas analysis, microscope imaging, step-scan and dedicated semiconductor research.


The FT/IR-4000 and FT/IR-6000 Series of FTIR spectrometers redefine the this powerful, easy-to-use technique. Each compact model offers reliable operation with some of the highest performance parameters in the industry.  Including a sealed interferometer with corner-cube mirrors and AccuTrac™ DSP technology for rapid and accurate tracking of mirror position and velocity for optimum wavenumber precision and signal-to-noise performance. The FTIR Series includes the intuitive Spectra Manager™ Suite with integrated search software solution, KnowItAll® Informatics and database JASCO Edition.

FTIR Spectrometers System Features


The interferometer is manufactured as a solid cast aluminum block  and is completely sealed. The FT/IR-4000 uses a 45 deg Michelson interferometer and the FT/IR-6000 uses a 28 degree Michelson interferometer. A near frictionless bearing (without the need for a gas supply) supports the moving mirror which is driven by a ‘voice coil’ for accurate vibration free movement.  Laser tracking of the moving mirror is made using Accutrac™ with the latest in digital signal processing. The standard KRS-5 windows prevent hygroscopic damage often seen with KBr windows used on some products.

Purgeable Optics

All models include a fully sealed and desiccated interferometer chamber. In addition, an integrated purge for the optical system is included as standard.

Corner-Cube Mirrors

Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times. Eliminating the need for dynamic alignment.

FT-IR Spectrometers Scanning

Excellent S/N Ratio

The highly stable interferometer with high intensity two-stage light source   offers optimum signal-to-noise performance starting at 28,000:1 and up to 55,000:1 (under standardized conditions).

High Sensitivity Electrically Cooled DLaTGS Detector

A highly sensitive and stable DLATGS detector is standard for all instruments. The DLATGS detector element is temperature-controlled using the Peltier effect.

Additional Detectors

Many optional detectors cover the range from 25,000 to 5 cm-1 and include several LN2 cooled MCT detectors for wide, narrow and mid band, Other include SiPD, InGaAs, Bolometer, etc.

Wavenumber Extension

The working range can be extended from the visible to far-IR by switching various optical components, such as source, windows, beam splitter and detector.

Vibration-Free Optical Bench

A specially designed vibration-proof mounting of the optical bench completely eliminates interference from external vibrations.

GxP Support

For laboratories compliant with GxP regulations, an instrument validation routine is provided as standard to verify instrument performance compliant with ASTM, EP, and JP procedures.

Microscope/IR Imaging

The IRT-1000, 5000 or 7000 infrared microscope models can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument.

FTIR Spectrometers System Details

Start Button

The Start Button on the instrument allows immediate start of sample measurement with a single push of the button. This is a convenient alternative to keyboard and mouse operation when starting data measurement.

IQ Start

A sequence of operations, including data processing, can be defined in a sequence in the  Spectra Manager measurement application, the sequence can started by the press of the Start button for fast and comprehensive measurement.

IQ Accessory Recognition

Automatic recognition of the sampling accessory is made when it is fitted into the sample compartment. It can also be used to automatically load measurement parameters matched to the accessory; this ensures that data is acquired using the correct parameters.

Rapid Scan

Rapid Scan is optional for the FT/IR-4600, FT/IR-4700, FT/IR-6600, and FT/IR-6700 and a standard feature for the FT/IR-6800. Rapid Scan can be used for fast spectral acquisition using interval analysis.

Step Scan

Several Step Scan options are available for the FT/IR-6000 Series.  These include microsecond and nanosecond TRS, phase modulation and amplitude modulation.

Spectral Search

The Sadtler search software package, “KnowItAll® Informatics System, JASCO Edition” with a library of 12,000 chemical and polymer spectra is standard (except LE versions) and with 3 month access to HaveItAll with 260,000 IR spectra.

Full Vacuum

All FTIR optical benches include multi-zone nitrogen purge as standard. The FT/IR-6000 Series can be fitted with several vacuum options, and can be configured from full vacuum or with vacuum interferometer and detector compartments ,with the sample chamber nitrogen purged.

FTIR Spectrometer Models

FTIR Spectrometer Models

FT/IR-4000 Series


Compact fixed range FTIR spectrometer

FT/IR-4000 Series


Research FTIR system with flexible configurations

FT/IR-4000 Series


FT-Raman spectroscopy virtually eliminates fluorescence and impurities from the sample

ATR Accessory Attenuated Total Reflectance

ATR Accessory Attenuated Total Reflectance

An ATR accessory is one of the most practical choices for sample measurement. In most cases there is very little requirement for sample preparation. The ATR Pro One and ATR Pro One View are the ‘signature’ single reflection monolithic diamond models with wide spectral range and high optical throughput. Versatile models include: wide range sample temperature control, polarization and environmental control.


Single-Reflection A

ATR Prism Diamond (High-throughput type,
Wide-band type) ZnSe, Ge
ATR/Sample Contact Area 2.5 mm diameter (ZnSe, Ge)
1.8 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2 (ZnSe, Ge)
700 kg/cm2 (Diamond)

Single-Reflection ATR with Camera

ATR Prism Diamond (High-throughput type and Wide-band type). ZnSe, Ge (without image)
ATR/Sample Contact Area 2.5 mm diameter (ZnSe, Ge)
1.8 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2 (ZnSe, Ge)
700 kg/cm2 (Diamond
Software Real-time image and recording in data file with Spectra Manager™

High-Pressure Single-Reflection ATR

ATR Prism Diamond
ATR/Sample Contact Area 2.0 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 1,700 kg/cm2 (Diamond)

Multi-Reflection ATR

ATR Prism ZnSe, Ge
ATR/Sample Contact Area 5 x 20 mm
No. of Reflections 5
Angle of incidence 45°

Electrochemical ATR

ATR Prism Diamond, ZnSe, Ge
ATR/Sample Contact Area 1.5 mm diameter
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2

Sample-Shielding Single-Reflection ATR

ATR Prism ZnSe, Ge, Diamond (550S-S)
Diamond (570S-H)
ATR/Sample Contact Area 1.5 mm diameter (ZnSe, Ge)
2.0 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2 (550S-S)
1,700 kg/cm2 (570S-H)

Polarizer Single-Reflection ATR

ATR Prism ZnSe, Ge, Diamond (610P-S)
Diamond (630P-H)
ATR/Sample Contact Area 1.5 mm diameter (ZnSe, Ge)
2.0 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2 (610P-S)
1,700 kg/cm2 (630P-H)
Polarizer/Analyzer Wire-grid polarizer (KRS-5)
Polarizer Rotation Angle 0 - 360°

65o Incident-Type Single-Reflection ATR

ATR Prism Ge
ATR/Sample Contact Area 3.0 mm diameter
No. of Reflections 1
Angle of Incidence 65°
Maximum Sample Size 6 inches
* A polarizer and attenuator mesh are optional

Temperature Controlled Single-Reflection ATR

ATR Prism ZnSe, Ge, Diamond (670H-S)
Diamond (690H-H)
ATR/Sample Contact Area 1.5 mm diameter (ZnSe, Ge)
2.0 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2 (670H-S)
1,700 kg/cm2 (690H-H)
Operating Temperature 180°C (Diamond)
150°C (Ge)
120°C (ZnSe)
* A connector panel is required when this accessory is fitted to the FT/IR-6000FV.

Large Sample Single-Reflection ATR

ATR Prism ZnSe, Ge, diamond (High-throughput type, Wide-band type)
ATR/Sample Contact Area 2.5 mm diameter (ZnSe, Ge)
1.8 mm diameter (Diamond)
No. of Reflections 1
Angle of Incidence 45°
Pressure 400 kg/cm2 (ZnSe, Ge)
700 kg/cm2 (Diamond)

Diffuse Reflectance

Diffuse Reflectance

Diffuse reflectance is a useful technique for samples with a roughened surface which are not amenable to transmission or ATR measurement, such as some powders, pharmaceuticals, plastics and food products etc. The diverse range of diffuse reflectance products includes heated, vacuum and automatic sampling accessories.


Multi-Sample Diffuse Reflectance

Sampling 7-position sample holder x 2
IQ Accessory Available
Smart Purge Available

DR-650Ai Bi, Ci
Vacuum/Heated Diffuse Reflectance

Cell Temperature 1000°C (Ai), 800°C (Bi), 600°C (Ci)
Vacuum Level 0.13 Pa
Sample Size 6 mm in diameter
Window Material KBr
Gas Flow Available
Heater Kanthal heater
Cell Cooling Method Water-cooled
IQ Accessory Available
* Temperature controller and related software are optional

Diffuse Reflectance

Sampling 5-position sample holder

Near IR Diffuse Reflectance

Wavelength Range 15,000 - 4,000 cm-1
Angle of Incidence 11.2°
Spot Size 10 mm in diameter
Reference Material Diffusion plate for reference
IQ Accessory Available
Option Test tube holder
Pellet holder
Powder sample holder

Smart Tech Multi-Sample Diffuse Reflectance


The KBr tablet method and the diffuse reflection method are available as measurements using an infrared spectrophotometer.

For these measurements, it is necessary to dilute the sample with KBr, and for the tablet method, pretreatment such as molding into tablets with a press is required.

By using Smart Tech, pretreatment can be easily performed and efficient infrared diffuse reflectance measurement can be performed.

* Attached to the FT / IR sample chamber.

The Smart 400i is made from the following components:


Smart Tech body (1.)

Sampling holder (2.)

Cell holder (3.)

Sample cell (4.)


There are a wide variety of measurement targets such as inorganic and organic powder samples, hard samples such as plastics, and liquid samples. In particular, the file-shaped protrusions on the cell surface are a major feature that allow for the scraping of hard samples and uniform sampling.

For powder samples

You can sample by placing the sample on the center of the sample cell and spreading it so that the surface is uniform.

For solid samples

The sample is scraped off on the cell surface, and the sample adhered to the cell surface is measured.

For liquid samples

It can be sampled by dropping one or two drops of the sample in the center of the cell.

Flow of measurement

Set the sampled cell in the 5 cell holder.

Measurement can be performed by setting the 5-cell cell holder in Smart Tech.

If you have one sample or the like, you can set the sampling holder as it is in Smart Tech instead of the 5-cell cell holder and perform measurements.

Measurement of methamphetamine (stimulant)

The KBr tablet method and diffuse reflection method are used for infrared measurement of stimulants.

Since these measurements require pretreatment such as dilution, there is a problem that analysis time is required when processing many samples.

Since Smart Tech does not require any operation such as dilution, you can perform analysis quickly.


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